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A high-purity Al alloy and a supersaturated Al-0.3wt.% Sc alloy were accumulative roll bonded (ARB) at 200 °C to generate 0.5 mm gauge sheet consisting of 32 alternating layers of Al and Al(Sc). The material was subsequently annealed for 6h at 350 °C. The deformation and annealed microstructures were investigated using transmission electron microscopy (TEM) and electron backscatter diffraction (EBSD). The deformation microstructure composed primarily of lamellar bands of unequal fineness with shear bands and deformation bands being additional substructural features in the Al(Sc) layers. The high strain deformation generated Al layers containing lamellar boundaries separated by a large fraction of high angle grain boundaries, thereby creating the ideal microstructure for continuous recrystallization. Annealing of the as-deformed material generated a hybrid microstructure consisting of alternating layers consisting of ~20 0m grains produced by continuous recrystallization (Al layers) and a lightly recovered substructure (Al(Sc) layers); the latter were highly resistant to recrystallization due to precipitation of nanosized Al3Sc particles during annealing.

A multilayered sheet composite of commercial purity Al and Al-0.3%Sc alloys was produced by accumulative roll bonding. The final sheet material consisted of 64 ultra fine grained layers, each of ~7.8mm in thickness. The as-deformed material was annealed at temperatures ranging from 250 to 350°C to study the changes in microstructure and their associated influence on mechanical properties. The as-deformed structures largely comprised of high angle grain boundaries in the Al layers and low angle grain boundaries in the Al(Sc) layers. During annealing, the structures in the Al(Sc) layers remained unaltered, whereas the Al layers recrystallized rapidly to the full layer thickness. The mechanical properties of the Al-Al(Sc) composite were measured and found to be unique in strength and ductility with annealing temperature having a significant influence on these properties.