The thermoemf in bipolar semiconductors is calculated. It is shown that it is necessary to take into account the nonequilibrium distribution of electron and hole concentrations (Fermi quasilevels of the electrons and holes). We find that electron and hole electric conductivities of contacts of semiconductor samples with connecting wires make a substantial contribution to thermoemf. 72.20.PaTypeset using REVT E X

In this Communication, it is shown that models used for describing generation and recombination of electrons and holes lead to disagreements with Maxwell's electrodynamics. Self-consistent expressions, more adequately depicting the actual physical processes of electron-hole recombination in semiconductors are obtained. It is shown that the electron and hole lifetimes can be defined correctly only for the special cases when the electron and hole nonequilibrium concentrations are the same, these lifetimes being equal. The influence of temperature inhomogeneity on the recombination is also considered. The recombination rate for hot electrons is obtained in the case when the electron and hole temperatures differ.

No abstract

A new approach is presented to thermoelectric phenomena, as a linear transport process of nonequilibrium charge carriers. The role of non-equilibrium carriers, as well as surface and bulk recombination, has shown to be crucial even within the linear approximation. Electron and hole Fermi quasilevels that appeared in a thermal field are calculated for the case of thermoelectric current flow through a circuit and the corresponding boundary conditions are obtained. It is shown for the first time that the Fermi quasi-level of one of the subsystems of quasi-particles, can be a non-monotonous function of the coordinates. General expressions for the thermoelectric current, thermo-e.m.f., and electrical resistance of bipolar semiconductors have been obtained. For the first time, surface recombination and surface resistance were taken into account in thermoelectric phenomena.