Graphene Oxide (GO) was chemically synthesized from Natural Flake Graphite (NFG). The GO was chemically reduced to Reduced Graphene Oxide (RGO) using hydrazine monohydrate. Thin films of GO and RGO were also deposited on sodalime glass substrate using spray pyrolysis technique (SPT). The samples were characterized using Fourier Transform Infrared (FTIR) spectroscopy, Scanning Electron Microscopy (SEM) with Energy Dispersive X-Ray (EDS) facility attached to it, UV-Visible Spectrometry and Four-Point probe. The FTIR spectra showed the addition of oxygen functionality groups in GO while such groups was drastically reduced in RGO. SEM micrograph of GO thin film showed a porous sponge-like structure while the micrograph of RGO thin film showed evenly distributed and well connected graphene structure. The EDX spectrum of RGO showed that there was decrease in oxygen content and increase in carbon content of RGO when compared to GO. The optical analysis of the GO and RGO thin films gave a direct energy bandgap of 2.7 eV and 2.2 eV respectively. The value of sheet resistance of GO and RGO films was determined to be 22.9 × 10 6 Ω/sq and 4.95 × 10 6 Ω/sq respectively.

Abstract. Thin films of LixMoyOz have been deposited on glass substrate in a one step chemical vapour deposition using a single source solid precursor. The films were characterized using Rutherford Backscattering Spectroscopy (RBS), X-Ray Diffractometry, Scanning Electron Microscopy (SEM), Impedance Spectroscopy (IS), van der Pauw conductivity measurement and Ultraviolet-Visible Spectroscopy. Results of the characterization showed that the films are dendritic, polycrystalline and semiconducting with an optical transition energy of 3.0 eV. IS characterization gave a semicircle in the complex impedance plot. The conductivity vs. temperature plot showed a transition at 450 ~ and also a hysteresis. Analysis showed the film to be mixture of phases.

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This article describes the organization of a service-learning robotics outreach and mentorship programme in an engineering department of a developing country. The programme is designed to tackle the problem of lack of integrative courses in engineering programmes and the lack of interest in science technology engineering and mathematics subjects among primary and secondary school students. Under the programme, a robotic team is formed consisting of undergraduate engineering students as mentors/coaches and primary and secondary school students as team members. The team members are taught how to design, build, and program robots to solve challenges by their mentors. The programme is intended to foster creative problem-solving abilities of students in science technology engineering and mathematics subjects at all levels of education in the context of a resource-constrained teaching and learning environment. The impacts of the programme are also reported.

Emitter tip radius nonuniformity results in exponential variations in emission current and a relatively low array utilization. Here, we provide a method of mapping the current and field-factor from a single emitter over a small area using a scanning anode field emission microscope. A dull W probe is used as the anode, and an array of emitters is fabricated on silicon (Si) wafers. We use a relatively wide spaced (100 [Formula: see text]m pitch) emitter array with each emitter having an integrated Si pillar. Current-voltage characteristics are used to extract the field-factor and to experimentally demonstrate the mapping of the currents and field-factor of a single emitter. From emission spot sizes, the emission half-angles are measured to be [Formula: see text] at anode voltages 2.5 kV and a minimum resolvable feature of 2–3 [Formula: see text]m at 1.8 kV. We also determine the field-factor dependence with the distance between the anode and the emitter, where limiting the current becomes essential to prevent early burn-out of the emitter that could reduce the current. We also simulated the maximum currents tolerated by the pillar to assess the thermal effects on the emitter. Finite element modeling confirms the experimental trend in the field-factor with the distance between the anode and the emitter tip, resulting in a value of approximately [Formula: see text] cm[Formula: see text] for an emitter tip radius of 5 nm and an emitter-anode distance of 50 [Formula: see text]m.