A new picosecond lifetime measurement system developed at UNISOR was used to determine the half-life of the well-deformed [Formula: see text] levels in 188Hg and 186Hg. The half-life values were measured to be 204±45 ps in 188Hg and ≤52 ps in 186Hg. The corresponding values of ρ2(E0)×103, obtained from the partial half-lives, were [Formula: see text] and ≥32, respectively. Additionally, the half-lives of the [Formula: see text] levels were determined to be 141±31 ps in 188Hg and 48±27 ps in 186Hg.
A technique is developed for lifetime measurements of partially autoionizing levels using the time of flight method of the beam-foil and two-foil techniques at various beam energies. The decay curve of the 5.17-keV peak in heliumlike vanadium shows the presence of nonidentical decay constants in beam single-foil experiment in contrast to the growth structures in beam-two-foil measurements at different beam energies. Analysis of such data has not only confirmed the satellite blending problem of the M 2 line 1s 2 1 S 0 -1s2p 3 P 2 o , but has also led to the mean lifetime measurement of the partially autoionizing satellite level of the 1s2s2p 4 P 5/2 o line in lithiumlike vanadium. The lifetime so measured is compared with theoretical calculations.
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