We report a quantitative x-ray absorption spectroscopy (XAS) study of the orientation of carbon nanotubes (CNTs) grown on plain SiO2(thickness 8 nm)/Si(100) substrates by a catalytically enhanced dc hot filament chemical vapour deposition (CVD) process. The alignment and orientation of CNT films are generally provided in the literature by scanning electron microscope (SEM) and transmission electron microscope (TEM) images qualitatively. A very few other techniques have been used to more deeply study the alignment of CNTs grown by the CVD technique, such as x-ray diffraction (XRD) or grazing-incidence small-angle x-ray scattering (GISAXS). XAS recorded on the C K-edge provides information on the local environment around carbon atoms and helps us study the orientation of CNTs. We find spectral features very similar to those of HOPG, in agreement with the literature. Meanwhile, we do not observe any extinction of the π* band at grazing incidence. CNTs have an averaged direction perpendicular to the surface of the substrate.

Carbon-based nanostructures continue to attract a disproportionate share of research effort because of their wide range of properties. This research includes synthesis techniques and controlling the structure and morphology of nanomaterials, since for many applications tedious manipulations are often required. One of the problems faced in such a characterization is contamination. Carbon nanotubes (CNTs) have been synthesized by hot filament plasma enhanced catalytic chemical vapour deposition (HF PE CCVD) and investigated by x-ray absorption near-edge spectroscopy (XANES). The spectra showed that samples with a large surface curvature are less sensitive to thermal treatment. Among the contaminants, we find potassium, which may have come from the beam line.

X-Ray Absorption Spectroscopy (XAS) on the carbon K edge of carbon nanostructures (nanotubes, nanofibers, nanowalls) is reported here. They are grown on plain SiO2 (8 nm thick)/Si(100) substrates by a Plasma and Hot Filaments-enhanced Catalytic Chemical Vapor Deposition (PE HF CCVD) process. The morphology and the nature of these carbon nanostructures are characterized by SEM, TEM and Raman spectroscopy. According to conditions of catalyst preparation and DC HF CCVD process, carbon nanotubes (CNTs), carbon nanofibers (CNFs), carbon nanowalls (CNWs), carbon nanoparticles (CNPs) with different orientation of the graphene plans or shells can be prepared. From the angular dependence of the incident light and geometrical morphology of the nanostructures, wide variations of the C K-edge intensity of the transitions to the empty * π and * σ states occur. A full lineshape analysis of the XAS spectra has been carried out using a home-made software, allowing estimating the relative proportion of * π and * σ transitions. A geometrical model of the angular dependence with the incidence angle of the light and the morphology of the carbon nanostructures is derived. With normalization to the HOPG (Highly Oriented Pyrolytic Graphite graphite) reference case, a degree of alignment can be extracted which is representative of the localized orientation of the graphitic carbon π bonds, accounting not only for the overall orientation, but also for local defects like impurities incorporation, structural defects ... This degree of alignment shows good agreement with SEM observations. Thus CNTs films display degrees J. M. Mane et al. 967 of alignment around 50%, depending on the occurrence of defects in the course of the growth, whereas no special alignment can be detected with CNFs and CNPs, and a weak one (about 20%) is detected on CNWs.

No abstract

No abstract