No abstract

A technique for selective characterization of the structure of free and buried thin-film interfaces by vibrationally resonant sum frequency generation spectroscopy is described. Manipulation of Fresnel coefficients by choice of film thickness on a reflecting substrate allows simultaneous optimization of the signal from the desired interface and minimization of the signal from other interfacial sources. This technique is demonstrated for the free polystyrene (PS)/air and the buried PS/spin-on glass interfaces. Our spectra show that the pendant phenyl group orientation is similar at the buried and free interfaces, with the phenyls pointing away from the bulk PS at each interface.

Vibrationally resonant sum-frequency generation (VR-SFG) and spectroscopic ellipsometry (SE) have been used to characterize self-assembled monolayer films of unsubstituted and mononitro-substituted oligo(phenylene−ethynylene) molecules on vapor-deposited Au substrates. When combined with quantum chemical calculations of the relevant transition moment directions, orientation distributions and electronic excitation spectra are obtained. The orientation distribution from VR-SFG is in good agreement with previous IR reflection studies, indicating both molecules are tilted from the surface normal by ∼30°. The calculated resonant hyperpolarizabilities are in good agreement with experimental spectra. The optical polarizability extracted from SE suggests strong intermolecular interactions, consistent with molecular exciton theory.