We report on metal-semiconductor-metal (MSM) photodetectors (PDs) fabricated on InAlGaN/GaN two-dimensional electron gas (2DEG) heterostructures. Electrical and photodetection properties were compared in two structures with and without an AlN spacer between the barrier (InAlGaN) and the GaN. The presence of the spacer hugely reduces the leakage current, allowing biasing at higher voltages. In photodetection, gain is obtained in both structures at a high bias. The photocurrent transient behavior revealed a faster response for excitation energy close to the GaN band edge than for energy above the barrier band edge. The fabrication and improvement of this type of device can lead to integration with the already mature high-electron-mobility transistor (HEMT) technology.

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InxGa1–xN/GaN single and multi quantum well (MQW) structures with x ≈ 0.13 were investigated optically by photoreflectance, photoluminescence excitation spectroscopy, and luminescence. Clear evidence of unintentional indium incorporation into the nominal GaN barrier layers is found. The unintentional In content is found to be around 3%. Inhomogeneous distribution of In atoms occurs within the distinct quantum well (QW) layers, which is commonly described as statistical alloy fluctuation and leads to the characteristic S-shape temperature shift of emission energy. Furthermore, differences in emission energy between the first and the other QWs of a MQW stack are found experimentally. This effect is discussed with the help of model calculations and is assigned to differences in the confining potential due to unwanted indium incorporation for the upper QWs.

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Electroreflectance (ER) spectra of InGaN/AlGaN/GaN p-n-heterostructures with multiple quantum wells (MQW) are studied. Structures with MQW InGaN/GaN were grown for blue LEDs by MOCVD technology and "flip-chip" mounted. The ER spectral maxima correspond to the high energy side of electroluminescence spectral line. The ER spectra caused by Franz-Keldysh effect are approximated by Aspnes theory. The ER spectra in a range 400 ÷ 800 nm have interference bands caused by the change of refraction index in the structure.Mater. Res. Soc. Symp. Proc. Vol. 955