The thermal, mechanical, and dielectric properties of new high-performance polyphenylene sulfide/aluminum nitride (AlN) composites prepared by hot pressing were investigated for use in electronic packaging. The coefficient of thermal expansion was decreased by 41%. The glass-transition temperature and Vickers microhardness were increased by 13°C and 46%, respectively, for the 15.1 vol.% AlN composite. A modified rule of mixtures with b of 0.065 fits the data. The dielectric constant and loss factor of the composites are within the range of requirements for commercial use.

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