Simple photolithographic techniques are used to fabricate single InP nanowire devices with back-to-back Schottky barriers. Direct imaging of the photoresponse shows that the active regions of the device are spatially localized near the reverse-biased Schottky barrier. By tuning the laser excitation energy from below to well above the energy gap, photocurrent spectroscopy can illuminate the zincblende or wurtzite nature of the nanowire device even at room temperature.

Photocurrent spectroscopy has been carried out on single CdS nanosheet devices in the metal-semiconductor-metal configuration with both Schottky and Ohmic contacts. Spatial imaging of the photocurrent shows that the photosensitive regions are localized at the reverse biased contact for Schottky type contacts and uniformly distributed throughout the nanosheet for Ohmic contacts. Photocurrent spectra show excitonic resonances at low temperatures corresponding to the A, B, C hole bands. Subband gap pulsed laser excitation reveals two-photon absorption dominated photocurrents consistent with a nonlinear coefficient of β=2 cm/GW for these nanosheet devices.

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