-Organic light-emitting diode (OLED) aging is the root cause for image sticking artifact and considered as the toughest problem besides the low yield problem of active-matrix organic light-emitting diode (AMOLED) displays. Digital driving can eliminate Mura artifact and allow a similar yield like LCD. However, it is more prone to OLED aging than analog driving, so that the lifetime will become shorter. In this paper, we pursue the approach to measure the pixel current and compensate OLED I-V drift. Information gained from electrical measurements during the lifetime of the display may be correlated to electro-optical drift, particularly the current efficiency. The aging model has to consider the dependence of I-V drift and efficiency loss on the operation point/voltage for each subframe. Specific compensation algorithms have been developed. Two AMOLED prototypes (1.5 and 2.8 in.) were validated. Burned-in pattern can be compensated, so the concept has been proven as effective. With the method described in this paper, digital AMOLED may reach a similar and even significantly higher lifetime than an analog AMOLED.
The feasibility of digital driving has been investigated, which may be an enabling technology for low‐cost, power‐efficient and high‐quality active matrix organic light emitting diodes displays (AMOLED displays). The theoretical requirements therefore are analyzed. Methods for avoiding imaging artifacts are proposed. Results based on two prototypes are presented showing that digital drive is feasible for state‐of‐the‐art manufacturing technology with comparable image quality to analog‐driven AMOLED displays but at lower power consumption and lower production cost.
In this article, we investigate the degradation behavior of blue organic light‐emitting diodes (OLEDs). Current–voltage–luminance characteristics were measured for various operational times. Analysis with respect to I–V drift and current efficiency degradation indicates that a compensation of OLED degradation may get feasible.
The feasibility of digital driving for active matrix organic light‐emitting diode is investigated. It offers simple 2T1C pixel circuit and low power consumption. However, it is susceptible to pixel aging, image sticking, and temperature variations. A novel nominal organic light‐emitting diode current measurement method is proposed enabling compensation for these effects using an image decomposition algorithm.
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