Controlling the propagation and coupling of light to sub-wavelength antennas is a crucial prerequisite for many nanoscale optical devices. Recently, the main focus of attention has been directed towards high-refractive-index materials such as silicon as an integral part of the antenna design. This development is motivated by the rich spectral properties of individual high-refractive-index nanoparticles. Here we take advantage of the interference of their magnetic and electric resonances to achieve strong lateral directionality. For controlled excitation of a spherical silicon nanoantenna, we use tightly focused radially polarized light. The resultant directional emission depends on the antenna's position relative to the focus. This approach finds application as a novel position sensing technique, which might be implemented in modern nanometrology and super-resolution microscopy set-ups. We demonstrate in a proof-of-concept experiment that a lateral resolution in the Ångström regime can be achieved.

Following Mie theory, nanoparticles made of a high-refractive-index dielectric, such as silicon, exhibit a resonator-like behavior and very rich resonance spectra. Which electric or magnetic particle mode is excited depends on the wavelength, the refractive-index contrast relative to the environment, and the geometry of the nanoparticle itself. In addition, the spatial structure of the impinging light field plays a major role in the excitation of the nanoparticle resonances. Here, it is shown that, by tailoring the excitation field, individual multipole resonances can be selectively addressed while suppressing the excitation of other particle modes. This enables a detailed study of selected individual resonances without interference by the other modes

Angström precision localization of a single nanoantenna is a crucial step towards advanced nanometrology, medicine and biophysics. Here, we show that single nanoantenna displacements down to fewÅngströms can be resolved with sub-Ångström precision using an all-optical method. We utilize the tranverse Kerker scattering scheme where a carefully structured light beam excites a combination of multipolar modes inside a dielectric nanoantenna, which then upon interference, scatters directionally into the far-field. We spectrally tune our scheme such that it is most sensitive to the change in directional scattering per nanoantenna displacement. Finally, we experimentally show that antenna displacement down to 3Å is resolvable with a localization precision of 0.6Å.