This study focused on the performance of commercial AlGaN/InGaN/GaN blue light emitting diodes ͑LEDs͒ under high current pulse conditions. The results of deep level transient spectroscopy ͑DLTS͒, thermally stimulated capacitance, and admittance spectroscopy measurements performed on stressed devices, showed no evidence of any deep-level defects that may have developed as a result of high current pulses. Physical analysis of stressed LEDs indicated a strong connection between the high intrinsic defect density in these devices and the resulting mode of degradation.

-Short-wavelength, visible-light emitting optoelectronic devices are needed for a wide range of commercial applications, including high-density optical data storage, full-color displays, and underwater communications. In 1994, high-brightness blue LEDs based on gallium nitride and related compounds (InGaN/AlGaN) were introduced by Nichia Chemical Industries[l]. The Nichia diodes are 100 times brighter than the previously available S i c blue LEDs. Group-111 nitrides combine a wide, direct bandgap with refractory properties and high physical strength. So far, no studies of degradation of GaN based LEDs have been reported. Our study, reported in this paper, focuses on the performance of GaN LEDs under high electrical stress conditions. Our observations indicate that, in spite of a high defect density, which normally would have be fatal to other III-V devices, defects in group-111 nitrides are not mobile even under high electrical stress. Defect tubes, however, can offer a preferential path for contact metals to electromigrate towards the p-n junction, eventually resulting in a short. The proposed mechanism of GaN diode degradation raises concern for prospects of reliable lasers in the group-III nitrides grown on sapphire.

-Short-wavelength, visible-light emitting optoelectronic devices are needed for a wide range of commercial applications, including high-density optical data storage, full-color displays, and underwater communications. In 1994, high-brightness blue LEDs based on gallium nitride and related compounds (InGaN/AlGaN) were introduced by Nichia Chemical Industries[l]. The Nichia diodes are 100 times brighter than the previously available S i c blue LEDs. Group-111 nitrides combine a wide, direct bandgap with refractory properties and high physical strength. So far, no studies of degradation of GaN based LEDs have been reported. Our study, reported in this paper, focuses on the performance of GaN LEDs under high electrical stress conditions. Our observations indicate that, in spite of a high defect density, which normally would have be fatal to other III-V devices, defects in group-111 nitrides are not mobile even under high electrical stress. Defect tubes, however, can offer a preferential path for contact metals to electromigrate towards the p-n junction, eventually resulting in a short. The proposed mechanism of GaN diode degradation raises concern for prospects of reliable lasers in the group-III nitrides grown on sapphire.

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