When
nanoparticles interact with cellular or organelle membranes, the coating
ligands are known to affect the integrity of the membranes, which
regulate cell death and inflammation. However, the molecular mechanisms
of this modulation remain unresolved. Here, we use synchrotron X-ray
liquid surface scattering and molecular dynamics simulations to study
interface structures between phospholipids and gold nanorods (AuNRs)
coated by surfactant and polyelectrolyte. These ligands are two types
of widely used surface modification with different self-assembled
structures and stabilities on the surface of nanoparticles. We reveal
distinct mechanisms of the ligand stability in disrupting membrane
integrity. We find that the cationic surfactant ligand cetyltrimethylammonium
bromide detaches from the AuNRs and inserts into phospholipids, resulting
in reduced membrane thickness by compressing the phospholipids to
align with the shorter ligand. Conversely, the cationic polyelectrolyte
ligand poly(diallyldimethylammonium chloride) is more stable on AuNRs;
although it adsorbs onto the membrane, it does not cause much impairment.
The distinct coating ligand interactions with phospholipids are further
verified by cellular responses including impaired lysosomal membranes
and triggered inflammatory effects in macrophages. Together, the quantitative
analysis of interface structures elucidates key bio–nano interactions
and highlights the importance of surface ligand stability for safety
and rational design of nanoparticles.
In combination with a single-crystal diamond anvil cell (DAC), a polycapillary half-lens (PHL) re-focusing optics has been used to perform high-pressure extended X-ray absorption fine-structure measurements. It is found that a large divergent X-ray beam induced by the PHL leads the Bragg glitches from single-crystal diamond to be broadened significantly and the intensity of the glitches to be reduced strongly so that most of the DAC glitches are efficiently suppressed. The remaining glitches can be easily removed by rotating the DAC by a few degrees with respect to the X-ray beam. Accurate X-ray absorption fine-structure (XAFS) spectra of polycrystalline Ge powder with a glitch-free energy range from -200 to 800 eV relative to the Ge absorption edge are obtained using this method at high pressures up to 23.7 GPa, demonstrating the capability of PHL optics in eliminating the DAC glitches for high-pressure XAFS experiments. This approach brings new possibilities to perform XAFS measurements using a DAC up to ultrahigh pressures.
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