A controlled decoherence environment is studied experimentally by free electron interaction with semiconducting and metallic plates. The results are compared with physical models based on decoherence theory to investigate the quantum-classical transition. The experiment is consistent with decoherence theory and rules out established Coulomb interaction models in favor of plasmonic excitation models. In contrast to previous decoherence experiments, the present experiment is sensitive to the onset of decoherence.

The loss of contrast in double-slit electron-diffraction due to dephasing and decoherence processes is studied. It is shown that the spatial correlation function of diffraction patterns can be used to distinguish between dephasing and decoherence. This establishes a measure of time-reversibility that does not require the determination of coherence terms of the density matrix, while von Neumann entropy, another measure of timereversibility, does require coherence terms. This technique is exciting in view of the need to understand and control the detrimental experimental effects of contrast loss and for fundamental studies on the transition from the classical to the quantum regime.

No abstract

We show images produced by an electron beam deflector, a quadrupole lens and a einzel lens fabricated from conducting and non-conducting plastic using a 3D printer. Despite the difficulties associated with the use of plastics in vacuum, such as outgassing, poor conductivity, and print defects, the devices were used successfully in vacuum to steer, stretch and focus electron beams to millimeter diameters. Simulations indicate that much smaller focus spot sizes might be possible for such 3D-printed plastic electron lenses taking into account some possible surface defects. This work was motivated by our need to place electron optical components in difficult-to-access geometries. Our proof-of-principle demonstration opens the door to consider 3D-printed electron microscopes, whose reduced cost would make such microscopes more widely available. Potentially, this may have a significant impact on electron beam science and technology in general and electron microscopy in particular. digitalcommons.unl.edu