With further scaling of nanometer CMOS technologies, yield and reliability become an increasing challenge. This paper reviews the most important phenomena affecting yield and reliability. For each effect, the basic physical mechanisms causing the effect and its impact on transistor parameters are described. Possible solutions to cope/handle with these effects on the design level are discussed as well.

No abstract

No abstract

No abstract

This paper presents the design of a new Wienbridge topology. Its phase noise performance, low temperature dependency and low power consumption make it suitable for use in wireless sensor nodes and time-based sensor readout circuitry. The noise as well as temperature behavior of the oscillator is explained using extensive calculations. Measurements on 7 samples of the same batch show a temperature stability of 86 ppm C and a measured spread of 0.9% at an oscillation frequency of 6 MHz. The circuit consumes 66 W and is realized in a 65 nm technology measuring 150 m by 200 m. The measured phase noise figure of merit is 172 dB at a frequency offset of 100 kHz.