Reliability-based design optimization (RBDO) problems have been intensively studied for many decades. Since Hasofer and Lind [1974, “Exact and Invariant Second-Moment Code Format,” J. Engrg. Mech. Div., 100(EM1), pp. 111–121] defined a measure of the second-moment reliability index, many RBDO methods utilizing the concept of reliability index have been introduced as the reliability index approach (RIA). In the RIA, reliability analysis problems are formulated to find the reliability indices for each performance constraint and the solutions are used to evaluate the failure probability. However, the traditional RIA suffers from inefficiency and convergence problems. In this paper, we revisited the definition of the reliability index and revealed the convergence problem in the traditional RIA. Furthermore, a new definition of the reliability index is proposed to correct this problem and a modified reliability index approach is developed based on this definition. The strategies to solve RBDO problems with non-normally distributed design variables by the modified RIA are also investigated. Numerical examples using both the traditional and modified RIAs are compared and discussed.
This paper focuses on the parametric modeling and optimization of the chemical vapor deposition (CVD) process for the deposition of thin films of silicon from silane in a vertical impinging CVD reactor. The parametric modeling using radial basis function for various functions, which is related to the deposition rate and uniformity of the thin films, is studied. These models are compared and validated with additional sampling data. Based on the parametric models, different optimization formulations for maximizing the deposition rate and the working areas of thin film are performed.
RBDO problems have been intensively studied for many decades. Since Hasofer and Lind defined a measure of the second-moment reliability index, many RBDO methods utilizing the concept of reliability index have been introduced as the Reliability Index Approach (RIA). In the RIA, a reliability analysis problem is formulated to find the reliability index for each performance constraint and the solutions are used to evaluate the failure probability. However, the traditional RIA suffers from inefficiency and convergence problems. In this paper, we revisited the definition of the reliability index and revealed the convergence problem in the traditional RIA. Furthermore, a new definition of the reliability index is proposed to correct this problem and a modified Reliability Index Approach based on this definition is developed. Numerical examples using both the traditional RIA and the modified RIA are compared and discussed.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.