In epitaxially strained ferroelectric thin films and superlattices, the ferroelectric transition temperature can lie above the growth temperature. Ferroelectric polarization and domains should then evolve during the growth of a sample, and electrostatic boundary conditions may play an important role. In this work, ferroelectric domains, surface termination, average lattice parameter and bilayer thickness are simultaneously monitored using in situ synchrotron X-ray diffraction during the growth of BaTiO3/SrTiO3 superlattices on SrTiO3 substrates by off-axis radio frequency magnetron sputtering. The technique used allows for scan times substantially faster than the growth of a single layer of material. Effects of electric boundary conditions are investigated by growing the same superlattice alternatively on SrTiO3 substrates and 20 nm SrRuO3 thin films on SrTiO3 substrates. These experiments provide important insights into the formation and evolution of ferroelectric domains when the sample is ferroelectric during the growth process.

Molecular packing in laterally directed solution deposition is a strong function of variables such as printing speed, substrate temperature, and solution concentration. Knowledge of the ordering mechanisms impacts on the development of new processes and materials for improved electronic devices. Here, we present real-time synchrotron x-ray scattering results combined with optical video microscopy, revealing the stages of ordering during the deposition of organic thin films via hollow capillary writing. Limited long range ordering is observed during the initial crystallization, but it gradually develops over 3–4 s for a range of deposition conditions. Buckling of thin films is typically observed for deposition above room temperature. We infer that compressive stress originates from thermal transients related to solvent evaporation on timescales similar to the development of long range ordering. Under optimized conditions, elimination of cracks and other structural defects significantly improves the average charge carrier mobility in organic field-effect transistors.

In-situ synchrotron x-ray diffraction was performed during the growth of BaTiO3 thin films on SrTiO3 substrates using both off-axis RF magnetron sputtering and pulsed laser deposition techniques. It was found that the films were ferroelectric during the growth process, and the presence or absence of a bottom SrRuO3 electrode played an important role in the growth of the films. Pulsed laser deposited films on SrRuO3 displayed an anomalously high tetragonality and unit volume, which may be connected to the previously predicted negative pressure phase of BaTiO3.

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