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Ca1-xMgxCu3Ti4O12 material has been synthesized by chemical route for different compositions and thin films have been deposited by spin coating. X-ray diffraction and Raman spectroscopy were used for detailed characterization of this material for both powder and thin films. X-ray diffraction shows single phase film material for different compositions x < 0.80. The initial measurements on dielectric response indicates high dielectric constant > 10, 000 for the composition x = 0.1.

There is a great deal of interest in CaCu3Ti4O12 system for dielectric applications. We have studied Ca1-xSrxCu3Ti4O12 system for different compositions. The material is synthesized by sol-gel chemical solution route and thin films were deposited by spin coating. Thin films were investigated by x-ray diffraction and Raman spectroscopy for structural properties. These results indicate a solid solution for the compositions x = 0.00 to 0.80. The SEM micrographs shows the uniform films at 800° C, but the dielectric response of Ca1-xSrxCu3Ti4O12 (x = 0.00) shows the dielectric constant value below 200.