In this paper, the self-consistent, frequency-dependent dielectric constant ( ) and dielectric loss tan ( ) of several materials are determined over the range 2 to 30 GHz using a short-pulse propagation technique and an iterative extraction based on a rational function expansion. The simple measurement technique is performed in the time domain on representative printed circuit board wiring. Broadband, fully causal transmission-line models based on these results are generated up to 50 GHz for card wiring using low loss materials including BT, Nelco N4000-13, and Nelco N4000-13SI. Simulation and modeling results highlight the need for the accurate frequency-dependent dielectric loss extraction. Signal propagation based on these results shows very good agreement with measured step and pulse time-domain excitations and provides validation of the measurement and model generation technique.Index Terms-Dielectric loss extraction, lossy causal transmission-line models, printed circuit board characterization, short-pulse propagation measurement technique.

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In this paper the effect of metal roughness on the total loss, the extracted tan6, and signal integrity of typical interconnections found in printed-circuit boards is extracted from measurements on three different materials. The differing characteristics of the roughened metal cross sections are highlighted, and a simplified, practical, two-dimensional, causal, broadband modeling methodology is shown.