Cerium-containing nanoparticles (Ce-NPs) from geogenic and anthropogenic sources are frequently found in the environment, and the ability to determine the origins of Ce-NPs relies on the presence of other rare...

In time-of-flight mass spectrometry (TOFMS), ion detection is often achieved via electron multiplication followed by fast analog-to-digital conversion (ADC). This detection approach is chosen over time-to-digital conversion because it extends the dynamic range of TOFMS measurements, especially for transient analyses. However, fast ADC detection also introduces measurement noise fundamental to the electron multiplication process. In previous research, we demonstrated that TOFMS signals acquired with fast ADC follow a compound Poisson distribution in which the Poisson-distributed arrival of ions at the detector is compounded with the response profile of the electron multiplier. Here, we consider the influence of mass-to-charge (m/z)-dependent detector responses and their impact on particle-finding accuracy in single-particle inductively coupled plasma TOFMS (spICP-TOFMS). In spICP-TOFMS, highly time-resolved ion signals are recorded and particle signals are distinguished from background signals based on thresholding the data at m/z-specific critical values. Through Monte Carlo modeling with measured m/z-dependent detector responses, we generate compound Poisson model distributions and critical values that accurately account for the dispersion of measured signals. We test the accuracy of critical values through the analysis of dissolved element solutions and comparison of measured versus predicted event rates above critical value thresholds. The use of m/z-dependent compound Poisson critical values reduces false-positive particle identifications by one to two orders of magnitude compared to thresholding criteria based on normal or Poisson statistics. The improved accuracy and robustness of compound Poisson critical values enables automated multi-element particle finding in spICP-TOFMS.