In this paper we reverse engineer the Sony IMX219PQ image sensor, otherwise known as the Raspberry Pi Camera v2.0. We provide a visual reference for pixel non-uniformity by analysing variations in transistor length, microlens optic system and in the photodiode. We use these measurements to demonstrate irregularities at the microscopic level and link this to the signal variation measured as pixel non-uniformity used for unique identification of discrete image sensors.

Lens aberrations have previously been used to determine the provenance of an image. However, this is not necessarily unique to an image sensor, as lens systems are often interchanged. Photo-response non-uniformity noise was proposed in 2005 by Lukáš, Goljan and Fridrich as a stochastic signal which describes a sensor uniquely, akin to a "ballistic" fingerprint. This method, however, did not account for additional sources of bias such as lens artefacts and temperature.In this paper, we propose a new additive signal model to account for artefacts previously thought to have been isolated from the ballistic fingerprint. Our proposed model separates sensor level artefacts from the lens optical system and thus accounts for lens aberrations previously thought to be filtered out. Specifically, we apply standard image processing theory, an understanding of frequency properties relating to the physics of light and temperature response of sensor dark current to classify artefacts. This model enables us to isolate and account for bias from the lens optical system and temperature within the current model.

No abstract

No abstract

No abstract