The ind ex of refraction of fu sed-quartz gJass was determined for 24 wavelength s fr om 0.34669 to 3.5078 micron s, llsing the minimum-deviation m eth od . The whole ran ge \\"as covered with a single instrument. The variation in index between samples was determ ined; no definite variations in disp ersion were observed. Possible r elations bet wee n puri ty ancl ind ex ar e di sc ussed.

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The index of refraction of fused quartz glass was determined for 24 wavelengths from 0.34669 to 3.5078 microns, using the minimum deviation method. The whole range is covered with a single instrument. The variation in index between samples was determined and no definite variations in dispersion were observed. Possible relations between purity and index are discussed.

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