The polarization purity of 6.457- and 12.914-keV x rays has been improved to the level of 2.4×10(-10) and 5.7×10(-10). The polarizers are channel-cut silicon crystals using six 90° reflections. Their performance and possible applications are demonstrated in the measurement of the optical activity of a sucrose solution.

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It was predicted that, when a fast electron beam with some angular spread is normally incident on a resistivity gradient, magnetic field generation can occur that can inhibit beam propagation [A. R. Bell et al., Phys. Rev. E 58, 2471 (1998)]. This effect can have consequences on the laser-driven ion acceleration. In the experiment reported here, we compare ion emission from laser irradiated coated and uncoated metal foils and we show that the ion beam from the coated target has a much smaller angular spread. Detailed hybrid numerical simulations confirm that the inhibition of fast electron transport through the resistivity gradient may explain the observed effect

We report on the realization of an extremely sensitive X-ray polarization microscope, allowing to detect tiniest polarization changes of 1 in 100 billion (10-11) with a μm-size focused beam. The extreme degree of polarization purity places the most stringent requirements on the orientation of the polarizer and analyzer crystals as well as the composition and the form fidelity of the lenses, which must not exhibit any birefringence. The results show that these requirements are currently only met by polymer lenses. Highly sensitive scanning X-ray polarization microscopy thus is established as a new method. It can provide new insights in a wide range of applications ranging from quantum electrodynamics and quantum optics to X-ray spectroscopy, materials research, and laser physics.