Graphical display of the spatial distribution of elements in a specimen has been recognized as a powerful technique since the earliest days of electron-beam x-ray microanalysis. With recent advances in computing power and mass storage, it has become practical to save complete spectra at each pixel rather than simple window counts, providing great flexibility for analytical post-processing. The term "spectrum imaging" has been coined to describe such a data structure.Hunt and Williams give a concise summary of the advantages of spectrum imaging, including the ability to map an element which was not known to be present when the data were acquired, and the ability to integrate spectra from image regions of arbitrary shape to improve statistical precision. Quantitative analysis may also be applied at each pixel to produce a concentration map, which is more informative than the raw or perhaps background-subtracted window counts usually displayed. Sensitive discrimination of phases is possible using various fitting techniques on the pixel spectra, matching them against each other or against standards.