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An algorithm and the accompanying analysis is described for quickly and accurately orienting cubic crystals by Laue x-ray back reflection. This technique utilizes three parameters as inputs: the film-to-specimen distance, the radial distance from the center of the photograph, and the angular displacement from horizontal. The outputs consist of interplanar angles between and indices of the planes producing the diffraction spots as well as the appropriate coordinate positions of the poles of those planes on a Wulff net. Also included is a statistical analysis of the errors involved. By the self-consistent approach employed, interplanar accuracies of ±0.25° are obtained.

An x-ray diffraction technique for rapidly determining the crystallographic orientation of the growth axis of metal whiskers is described. The technique utilizes the x-ray short-wavelength limit to restrict the crystallographic planes capable of diffraction to those of low Miller indices.