Ion beam analysis (IBA) has been a powerful, non-destructive tool for archaeological research worldwide for over four decades, yet its full potential is seldom realized in North American archaeology. Herein the potential of particle induced X-ray emission spectrometry (PIXE) as a tool for future Ozarks chert provenance studies is evaluated based on its ability to facilitate (1) discrimination of Ozarks chert materials from different geological formations and (2) identification of discrete groups of artifacts from the same geological formation. In addition, PIXE was also used to evaluate the elemental heterogeneity of Ozarks chert materials. Thirty chert (microcrystalline quartz) artifacts were visually sorted and classified according to macroscopic features characteristic of certain chert resources from particular Ozarks geological formations. The elemental concentrations obtained from PIXE analysis underwent multivariate statistical analyses in order to gain insight from the data. The results indicate that PIXE could be a useful tool for assigning Ozarks chert materials to their respective geological formations, and possibly for determining regional or sub-regional provenance.