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Abstract:The magnetic characteristics of FINEMET type glass-coated nanowires and submicron wires are investigated by taking into account the structural evolution induced by specific annealing all the way from a fully amorphous state to a nanocrystalline structure. The differences between the magnetic properties of these ultrathin wires and those of the thicker glass-coated microwires and "conventional" wires with similar structures have been emphasized and explained phenomenologically. The domain wall propagation in these novel nanowires and submicron wires, featuring a combination between an amorphous and a crystalline structure, has also been studied, given the recent interest in the preparation and investigation of new materials suitable for the development of domain wall logic applications.

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A new method for measuring the domain wall velocity in a single, ultrathin ferromagnetic amorphous wire with the diameter down to 100 nm is presented. The method has been developed in order to increase the sensitivity in studying the domain wall propagation in bistable magnetic wires in a wide range of field amplitudes, with much larger values of the applied field as compared to those employed when studying the wall propagation in typical amorphous microwires. The large fields required to propagate the domain walls in ultrathin wires are able to nucleate new domain walls in the samples and, therefore, they can affect the accuracy of the entire measurement. The proposed experimental setup prevents such situations by using a number of complex pick-up coils, which allow the detection of the direction of the wall propagation along with the precise measurement of the domain wall velocity. The newly developed method is especially important now, when large effort is devoted to the development of domain wall logic devices based on ultrathin magnetic wires and nanowires.