Mn inclusion in the oxide based diluted magnetic semiconductor Zn1−x MnxO (x = 0.04, 0.06, 0.08, and 0.10) grown by standard high temperature solid state reaction technique has been studied. The local and average structure of Zn1−x MnxO was characterized by the super resolution technique maximum entropy method and pair distribution function analysis using the X-ray powder data. Magnetic studies on this material using a Vibrating Sample Magnetometer were also carried out to ascertain the doping level in Zn1−x MnxO.

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The mixed oxides Zn 1−x Mg x O were prepared as polycrystalline powders with various compositions (x = 0.02, 0.04, 0.05, and 0.10) using sol-gel technique. X-ray diffractometer (XRD) was used to characterize the powders for structural and electronic properties. X-ray diffraction analysis reveals that all the prepared samples exhibit the single wurtzite phase of zinc oxide (ZnO), and magnesiumdoping does not induce any secondary phase in the samples. The Bragg peak positions in the XRD patterns are found to be shifted towards higher 2θ values with more addition of magnesium in the zinc oxide lattice. Magnesium addition in the zinc oxide lattice is found to enhance the mid bond electron density distribution up to x = 0.05 and then decrease for x = 0.10. Evidence of host lattice as well as interstitial addition of Mg 2+ ions has been realized for x = 0.10, through electron density analysis.