The Manchester Metropalitan University, England Abet ract Thb paper maddrn the design and implunmntation of a 7B2-16 line code for m o p t i d A h W t d PPM @mm mp&yIng B PIN-FET rectiwr. A code word mrp & prumt.d and the c a d e r date probability diBtdbutlaa wduated. Tho 782-11) d e hu Bn &-ciency of 87. 11 % and it hu becn darigr.d N C~ that the d u n b e y in wd to ddmin thm t i d q jib tar uroei.lod with luge puh p d t h dupuitlsl, A lowrp6sd ham been Lmplrmmted and p r u t M d t a rbor th.t thm jitter Ir redurn to 18% of that of thn nncodsd c m 2 PPM PIN-FET Sensitivity 593 0 1992 IEEE v
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