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To increase slew rate of the source driver amplifier more bias current is needed in general. But this means shorter battery life. A new slew rate enhancement method that switches the compensation capacitor is proposed. By using it several times higher slew rate can be obtained without increasing bias current.

The dielectric constant and loss tangent of SrTiO3 thin films were characterized under the influence of an applied dc voltage at about 3.64 GHz. The measurement was carried out utilizing a gold resonator with a flip-chip capacitor at cryogenic temperatures. The analysis of the experimentally observed capacitance and quality factor served to give a measure of the dielectric constants and the loss tangents of the SrTiO3 film at microwave ranges, respectively. A dielectric constant of 830 and a low loss tangent of 6×10−3 at 3.64 GHz were observed at 90 K and 100 V. The dielectric loss decreases as the bias voltage increases. In addition, the quality of the SrTiO3 film is presented in terms of fractional frequency under the bias voltages and cryogenic temperatures.

Data retention may be affected by depolarization, domain stabilization (ageing or imprint), and fuzzy electric field among neighboring bits in relation to microstructures of ferroelectric media. In this paper, the smearing effect due to electric field between two adjacent bits was demonstrated. In order to minimize the smearing effect, ferroelectric media with the top electrode is proposed by which fuzzy electric field can be screened by bound charges in the electrode. Bit on electrode (BOE) technique was suggested for “Write” (local polarization) and “Read” on ferroelectric media with the top electrode (ferroelectric capacitor). It is noticed that a highly sensitive device such as single electron transistor is indispensable for measuring potential variation in the top electrode of the ferroelectric capacitor media.