Problems of measurement automation for creating a testing system are considered. This system accelerates the process of parameters controlling in the production and development of new samples of indicator (display) technology. The main parameters of the indicators are defined, the tasks of automation of measuring processes are indicated, the hardware and software structure of the system is developed. The main features of an integrated approach to solve the problems of automating the process of testing the structures of thin-film electroluminescent indicators were proposed, the parameters of thin-film electroluminescent indicators were considered as the basis for forming the composition of an automated testing complex, and the automation of processing the experimental results at the software level was described. The ideas outlined in this article make it possible to formulate a technical task for the development of a complex for automated measurement of the parameters of thin-film electroluminescent elements, as well as its components and software.

The algorithms, methods for measuring the structure parameters of thin-film electroluminescent indicators are studied. The algorithm for determining threshold voltage and plotting current – brightness characteristics was created. Realization of this algorithm accelerates process of monitoring of parameters by production known and development of new exemplars of indicator technique on the basis of thin-film electroluminescent indicators. The main aspects of a comprehensive approach to problem solving of automation of process of measurement of values of parameters of structures of thin-film electroluminescent indicators were designated, features of functioning of thin-film electroluminescent indicators as a basis of formation of structure of the device of the automated testing are considered, automation of processing of results of an experiment at the level of the software is described. Key parameters of indicators are determined, problems of automation of measuring processes are formulated, and the algorithm of determination of the threshold voltage and creation of voltage-brightness characteristic of the thin-film electroluminescent indicators in the automated mode is developed. The ideas explained in this article allow formulating the requirement specification on development of the device of the automated measurement of parameters of thin-film electroluminescent elements and also its constituents and the software.