In this studied gold (Au) nanoparticles doped tungsten oxide (WO3) thin film was deposited on porous silicon (PS) substrate at the substrate temperature of 250°C by spray pyrolysis deposition method, with different Au doping concentration of (0, 1, 3, and 5%). The gold nanoparticles GNPs were prepared by using normal atmospheric air cold plasma. All films were annealed at 500°C for 1h. The X-ray diffraction peaks indicated that all films are polycrystalline with a hexagonal structure. The surface morphology was studied by AFM. The average grain size for pure thin film WO3 was about 61 nm, and it decreased to be about 43.2 nm with increases the doping ratios for the film deposited at 5% of Au. FESEM image all doped and undoped films showed homogenous pattern structure on the porous silicon. The thickness of films was obtained from the cross-section of the FESEM, which was 323±5 nm. A blue-shifted showed based on the photolumenses (PL) peak position calculated of WO3 as doping ratio increased, the bandgap for Au: WO3 films lies between (2.85 to 3.02) eV.

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This study aims to prepare composite materials and improve some of their mechanical properties by using epoxy resin (EP) and polyurethane (PU) as the matrix material and nanoparticles (Al2O3) as reinforcing agents in different ratio with weight fractions (5%, 10%, and 15%). The results in the tables show that increasing the weight fraction of nanoparticles leads to an increase in the elasticity coefficient and durability of the impact and absorbed energy, with an increase in the temperature of the composite material reinforced with nanoaluminum oxide particles. The mechanical properties gradually decrease with the increase of the period of immersion in water.

Transparent thin films of CdO:Ce has been deposited on to glass and silicon substrates by spray pyrolysis technique for various concentrations of cerium (2, 4, and 6 Vol.%). CdO:Ce films were characterized using different techniques such as X-ray diffraction (XRD), atomic force microscopy(AFM) and optical properties. XRD analysis show that CdO films exhibit cubic crystal structure with (1 1 1) preferred orientation and the intensity of the peak increases with increasing's of Ce contain when deposited films on glass substrate, while for silicon substrate, the intensity of peaks decreases, the results reveal that the grain size of the prepared thin film is approximately (73.75-109.88) nm various with increased of cerium content. With a surface roughness of (0.871–16.2) nm as well as root mean square of (1.06-19.7) nm for glass substrate, while for silicon (84.79-107.48) nm, for a pure CdO and doped with Ce (2, 4, and 6 Vol.%). The 300-nm-thin CdO films showed that the optical energy band gap equal 2.6 eV, and increases with increasing doping until reaches a maximum value of 3.25 eV when doping levels 6 Vol.%.