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In this article, the effect of temperature on the photovoltaic parameters of mono-crystalline silicon Photovoltaic Panel is undertaken, using the Matlab environment with varying module temperature in the range 25˚C -60˚C at constant solar irradiations 200 -500 W/m 2 . The results show that the temperature has a significant impact on the various parameters of the photovoltaic panel and it controls the quality and performance of the solar panel. The photovoltaic parameters are the current of short circuit I sc , the open circuit voltage V co , the form factor FF, the maximum power P max as well as efficiency.The relative change of these photovoltaic parameters with temperature is also evaluated in this article. A DS-100M solar panel has been used as reference model. The results show also that the open circuit voltage, maximum power, fill factor and efficiency decrease with temperature, but the short circuit current increases with temperature. The results are in good agreement with the available literature.

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Industrial production constraints often require technical tests and controls. Optical metrology methods allow a non destructive test of wide range of parameters, such as defects and displacements, with very good accuracy. The phase retrieval is an effective way that allows three-dimensional profile reconstruction from intensity shearograms. This research work focuses on the extraction of the phase from one uncarrier shearogram using the Hilbert-Huang transform. An algorithm for the phase calculation based on the bidimensional empirical mode decomposition, Hilbert transform (HT), and Fourier transform (FT) is presented. A spatial digital carrier has been superimposed before the application of the FT or HT which uses two π 2 shifted shearograms, to get access to the phase map via a global analysis of intensity images. An evaluation was made through a numerical simulation to validate and confirm the performance of the proposed algorithm. The main advantage of this technique is its ability to provide a metrological solution for fast dynamic analysis.

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