Two-dimensional (2D) materials are being used widely for chemical sensing applications due to their large surface-to-volume ratio and photoluminescence (PL) emission and emission exciton band tunability. To better understand how the analyte affects the PL response for a model 2D platform, we used atomic force microscopy (AFM) and co-localized photoluminescence (PL) and Raman mapping to characterize tungsten disulfide (WS2) flakes on template-stripped gold (TSG) under acetone challenge. We determined the PL-based response from single- and few-layer WS2 arises from three excitons (neutral, A0; biexciton, AA; and the trion, A−). The A0 exciton PL emission is the most strongly quenched by acetone whereas the A− PL emission exhibits an enhancement. We find the PL behavior is also WS2 layer number dependent.
Porous silicon (pSi) exhibits strong photoluminescence (PL) and its PL is often exploited for chemical sensor development. However, the sensor response is not uniform across a pSi specimen. We use co-localized confocal PL and Raman scattering mapping to establish a relationship between the analyte-induced PL response and the silicon nanocrystallite size, size distribution, and amorphous silicon (aSi) contribution across a pSi specimen. Using toluene as a model analyte, high analyte-induced PL response is associated with areas within the specimen that have (i) low aSi content, (ii) silicon nanocrystallites having diameters between 2 and 5 nm, and (iii) silicon nanocrystallites that exhibit a narrow size distributions (≤1% relative standard deviation).
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