We report on the electrical and interfacial properties of nonalloyed Ti/Au ohmic and Pt Schottky contacts on Zn-terminated n-ZnO (1:5 Â 10 17 cm À3). Nonalloyed Ti/Au and Pt contacts on the Zn-terminated ZnO respectively exhibit ohmic and Schottky behavior owing to different work functions and out-diffusion characteristics. The nonalloyed Ti/Au contact reveals very linear current-voltage behavior with a specific contact resistivity of 2:2 Â 10 À5 cm 2. However, Pt contact shows Schottky behavior with Schottky barrier heights (SBHs) of 0.62 eV and 0.78 eV, obtained from current-voltage (I-V) and capacitance-voltage (C-V) measurements, respectively. Using Auger electron spectroscopy (AES), we correlated the electrical properties of the nonalloyed Ti/Au ohmic and Pt Schottky contacts with the properties of the interface between the metal and ZnO.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.