The silicon-vacancy (SiV) color center in diamond is a solid-state single photon emitter and spin quantum bit suited as a component in quantum devices. Here, we show that SiV centers in nanodiamonds exhibit a strongly inhomogeneous distribution with regard to the center wavelengths and linewidths of the zero-phonon-line (ZPL) emission at room temperature. We find that the SiV centers separate in two clusters: one group exhibits ZPLs with center wavelengths within a narrow range ≈730-742 nm and broad linewidths between 5 and 17 nm, whereas the second group comprises a very broad distribution of center wavelengths between 715 and 835 nm, but narrow linewidths from below 1 up to 4 nm. Supported by ab initio Kohn-Sham density functional theory calculations we show that the ZPL shifts of the first group are consistently explained by strain in the diamond lattice. Further, we suggest, that the second group showing the strongly inhomogeneous distribution of center wavelengths might be comprised of a new class of silicon-related defects. Whereas single photon emission is demonstrated for defect centers of both clusters, we show that emitters from different clusters show different spectroscopic features such as variations of the phonon sideband spectra and different blinking dynamics.

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We present a predictable single-photon source (SPS) based on a silicon vacancy centre in nanodiamond which is optically excited by a pulsed laser. At an excitation rate of 70 MHz the source delivers a photon flux large enough to be measured by a low optical flux detector (LOFD). The directly measured photon flux constitutes an absolute reference. By changing the repetition rate of the pulsed laser, we are able to change the photon flux of our SPS in a controllable way which in turn can act as a reference. The advantage of our method is that it does not require precise knowledge of the source efficiency, but the source is calibrated by the LOFD and can be used for detector responsivity characterizations at the few-photon level.

The total efficiency of the source (0.88 ± 0.04) × 10 −3 is given by the slope of the absolute photon flux (circle symbols, dashed line), while the slope for the APD count rate is (0.54 ± 0.02) × 10 −3 (cross symbols, solid line).

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