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Compositional generalization is a troubling blind spot for neural language models. Recent efforts have presented techniques for improving a model's ability to encode novel combinations of known inputs, but less work has focused on generating novel combinations of known outputs. Here we focus on this latter "decode-side" form of generalization in the context of gSCAN, a synthetic benchmark for compositional generalization in grounded language understanding. We present Recursive Decoding (RD), a novel procedure for training and using seq2seq models, targeted towards decode-side generalization. Rather than generating an entire output sequence in one pass, models are trained to predict one token at a time. Inputs (i.e., the external gSCAN environment) are then incrementally updated based on predicted tokens, and re-encoded for the next decoder time step. RD thus decomposes a complex, out-ofdistribution sequence generation task into a series of incremental predictions that each resemble what the model has already seen during training. RD yields dramatic improvement on two previously neglected generalization tasks in gSCAN. We provide analyses to elucidate these gains over failure of a baseline, and then discuss implications for generalization in naturalistic grounded language understanding, and seq2seq more generally.

The research and development cycle of advanced manufacturing processes traditionally requires a large investment of time and resources. Experiments can be expensive and are hence conducted on relatively small scales. This poses problems for typically data-hungry machine learning tools which could otherwise expedite the development cycle. We build upon prior work by applying conditional generative adversarial networks (GANs) to scanning electron microscope (SEM) imagery from an emerging advanced manufacturing process, shear-assisted processing and extrusion (ShAPE). We generate realistic images conditioned on temper and either experimental parameters or material properties. In doing so, we are able to integrate machine learning into the development cycle, by allowing a user to immediately visualize the microstructure that would arise from particular process parameters or properties. This work forms a technical backbone for a fundamentally new approach for understanding manufacturing processes in the absence of first-principle models. By characterizing microstructure from a topological perspective, we are able to evaluate our models’ ability to capture the breadth and diversity of experimental scanning electron microscope (SEM) samples. Our method is successful in capturing the visual and general microstructural features arising from the considered process, with analysis highlighting directions to further improve the topological realism of our synthetic imagery.

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Technological advances are in part enabled by the development of novel manufacturing processes that give rise to new materials or material property improvements. Development and evaluation of new manufacturing methodologies is labor-, time-, and resource-intensive expensive due to complex, poorly defined relationships between advanced manufacturing process parameters and the resulting microstructures. In this work, we present a topological representation of temper (heat-treatment) dependent material micro-structure, as captured by scanning electron microscopy, called TopTemp. We show that this topological representation is able to support temper classification of microstructures in a data limited setting, generalizes well to previously unseen samples, is robust to image perturbations, and captures domain interpretable features. The presented work outperforms conventional deep learning baselines and is a first step towards improving understanding of process parameters and resulting material properties.