The time-dependent charge carrier transport and recombination processes in low-mobility organic semiconductor diodes are obtained through numerical simulations using the finite element method (FEM). The application of a Lorentz force across the diode alters the charge transport process leading to the Hall effect. In this contribution, the Hall effect parameters, such as the Hall voltage and charge carrier concentration with varying magnetic fields, are computed for both Langevin and non-Langevin type recombination processes. The results indicate the charge carrier concentration within the diode for the Langevin system is about seven and fourteen times less while the maximum amount of extracted charge is nearly five and ten times less than that in the non-Langevin system of 0.01 and 0.001, respectively. The Hall voltage values obtained for the steady-state case are similar to the non-Langevin system of ββL=0.01. However, the values obtained for the Langevin and non-Langevin systems of ββL=1 and 0.001 exhibit anomalies. The implications of these findings advance the understanding of the charge transport and Hall effect measurements in organic semiconductors that underpins the device’s performance.

Charge transport characteristics in organic semiconductor devices become altered in the presence of traps due to defects or impurities in the semiconductors. These traps can lead to a decrease in charge carrier mobility and an increase in recombination rates, thereby ultimately affecting the overall performance of the device. It is therefore important to understand and mitigate the impact of traps on organic semiconductor devices. In this contribution, the influence of the capture and release times of trap states, recombination rates, and the Lorentz force on the net charge of a low-mobility organic semiconductor was determined using the finite element method (FEM) and Hall effect method through numerical simulations. The findings suggest that increasing magnetic fields had a lesser impact on net charge at constant capture and release times of trap states. On the other hand, by increasing the capture time of trap states at a constant magnetic field and fixed release time, the net charge extracted from the semiconductor device increased with increasing capture time. Moreover, the net charge extracted from the semiconductor device was nearly four and eight times greater in the case of the non-Langevin recombination rates of 0.01 and 0.001, respectively, when compared to the Langevin rate. These results imply that the non-Langevin recombination rate can significantly enhance the performance of semiconductor devices, particularly in applications that require efficient charge extraction. These findings pave the way for the development of more efficient and cost-effective electronic devices with improved charge transport properties and higher power conversion efficiencies, thus further opening up new avenues for research and innovation in this area of modern semiconductor technology.