Specific heat spectroscopy was used to study the dynamic glass transition of ultrathin poly(2-vinyl pyridine) films (thicknesses: 405-10 nm). The amplitude and the phase angle of the differential voltage were obtained as a measure of the complex heat capacity. In a traditional data analysis, the dynamic glass transition temperature T g is estimated from the phase angle. These data showed no thickness dependency on T g down to 22 nm (error of the measurement of AE3 K). A derivative-based method was established, evidencing a decrease in T g with decreasing thickness up to 7 K, which can be explained by a surface layer. For ultrathin films, data showed broadening at the lower temperature side of the spectra, supporting the existence of a surface layer. Finally, temperature dependence of the heat capacity in the glassy and liquid states changes with film thickness, which can be considered as a confinement effect.

A combination of nanosized dielectric relaxation (BDS) and thermal spectroscopy (SHS) was utilized to characterize the dynamics of thin films of poly(vinyl methyl ether) (PVME) (thicknesses: 7-160 nm). For the BDS measurements, a recently designed nanostructured electrode system is employed. A thin film is spin-coated on an ultraflat highly conductive silicon wafer serving as the bottom electrode. As top electrode, a highly conductive wafer with nonconducting nanostructured SiO nanospacers with heights of 35 or 70 nm is assembled on the bottom electrode. This procedure results in thin supported films with a free polymer/air interface. The BDS measurements show two relaxation processes, which are analyzed unambiguously for thicknesses smaller than 50 nm. The relaxation rates of both processes have different temperature dependencies. One process coincides in its position and temperature dependence with the glassy dynamics of bulk PVME and is ascribed to the dynamic glass transition of a bulk-like layer in the middle of the film. The relaxation rates were found to be thickness independent as confirmed by SHS. Unexpectedly, the relaxation rates of the second process obey an Arrhenius-like temperature dependence. This process was not observed by SHS and was related to the constrained fluctuations in a layer, which is irreversibly adsorbed at the substrate with a heterogeneous structure. Its molecular fluctuations undergo a confinement effect resulting in the localization of the segmental dynamics. To our knowledge, this is the first report on the molecular dynamics of an adsorbed layer in thin films.

Despite the decade long controversial discussion on the effect of nanometer confinement on the glass transition temperature (T g ) of ultrathin polymer films, there is still no consistent picture. Here, the dynamic calorimetric glass transition of ultrathin films of a blend, which is miscible in the bulk, is directly investigated by specific heat spectroscopy. By a self-assembling process, a nanometer thick surface layer with a higher molecular mobility is formed at the polymer/air interface. By measuring the dynamic calorimetric T g in dependence on the film thickness, it was shown that the T g of the whole film was strongly influenced by that nanometer thick surface layer, with a lower T g . Since the observed thickness dependence of the dynamic T g is similar to the thickness dependence of the T g for thin films of homopolymers, it is concluded that also for homopolymer a highly mobile surface layer is relevant for the widely observed T g depression.

The discussions on the nanoconfinement effect on the glass transition and glassy dynamics phenomena have yielded many open questions.Here, the thickness dependence of the thermal glass transition temperature T g therm of thin films of a PVME/PS blend is investigated by ellipsometry. Its thickness dependence was compared to that of the dynamic glass transition (measured by specific heat spectroscopy) and the deduced Vogel temperature (T 0 ). While T g therm and T 0 showed a monotonous increase, with decreasing film thickness, the dynamic glass transition temperature (T g dyn ) measured at a finite frequency showed a nonmonotonous dependence that peaks at 30 nm. This was discussed by assuming different cooperativity length scales at these temperatures, which have different sensitivities to composition and thickness. This nonmonotonous thickness dependence of T g dyn disappears for frequencies characteristic for T 0 . Further analysis of the fragility parameter showed a change in the glassy dynamics from strong to fragile, with decreasing film thickness.

Specific heat spectroscopy (SHS) employing AC nanochip calorimetry was used to investigate the glassy dynamics of ultra-thin films (thicknesses: 10 nm-340 nm) of a polymer blend, which is miscible in the bulk. In detail, a Poly(vinyl methyl ether) (PVME)/Polystyrene (PS) blend with the composition of 25/75 wt. % was studied. The film thickness was controlled by ellipsometry while the film topography was checked by atomic force microscopy. The results are discussed in the framework of the balance between an adsorbed and a free surface layer on the glassy dynamics. By a self-assembling process, a layer with a reduced mobility is irreversibly adsorbed at the polymer/substrate interface. This layer is discussed employing two different scenarios. In the first approach, it is assumed that a PS-rich layer is adsorbed at the substrate. Whereas in the second approach, a PVME-rich layer is suggested to be formed at the SiO substrate. Further, due to the lower surface tension of PVME, with respect to air, a nanometer thick PVME-rich surface layer, with higher molecular mobility, is formed at the polymer/air interface. By measuring the glassy dynamics of the thin films of PVME/PS in dependence on the film thickness, it was shown that down to 30 nm thicknesses, the dynamic T of the whole film was strongly influenced by the adsorbed layer yielding a systematic increase in the dynamic T with decreasing the film thickness. However, at a thickness of ca. 30 nm, the influence of the mobile surface layer becomes more pronounced. This results in a systematic decrease in T with the further decrease of the film thickness, below 30 nm. These results were discussed with respect to thin films of PVME/PS blend with a composition of 50/50 wt. % as well as literature results.