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Combining optical reflectometry and atomic force microscopy (AFM), we have studied the effects of the surfactant counterion on the adsorption isotherms, kinetics, and layer structure for cationic hexadecyltrimethylammonium (C16TA + ) surfactants on negatively charged silica surfaces. The adsorption kinetics suggest that the adsorption mechanism changes at the critical micelle concentration (cmc). A change in mechanism is also suggested by differences observed in the state of interfacial self-assembly on either side of the cmc. Above the cmc, increasing the binding affinity of the counterion (from chloride to bromide) increased the surface excess concentration by approximately 60% and changed the structure of the adsorbed surfactant layer from aggregates with circular projections to wormlike micelles. The addition of 10 mM KCl or KBr increased the surfactant surface excess concentration for both counterions. Below the cmc, the counterion has only a small effect on the structure of the adsorbed layer, and the isotherms are similar, provided the surfactant concentration is scaled by the appropriate cmc. By quantitatively analyzing the AFM images and comparing this to the surface excess concentration measured by reflectometry, we determined that surfactants pack differently in adsorbed aggregates than they do in aggregates formed by self-assembly in solution. Finally, we show that an impurity present in poly(vinyl chloride) tubing explains anomalous adsorption behavior previously reported for C16TAB on silica.