Previously, the addition of silicon dioxide (SiO2) improved the homogeneity of polymethyl methacrylate/50 % epoxidised natural rubber (PMMA/ENR 50) blend. However, the presence of SiO2 agglomerates limits its overall performance. The formation of these agglomerates was due to the hydrogen bonding interaction that form between the oxygen atoms in silanol groups (Si-OH) and hydrogen atoms from the surrounding moisture. Therefore, in this study, SiO2 were modified with dodecanoic acid (DOA) to reduce the number of Si-OH on the SiO2 surface using esterification technique. Interestingly, it was found that the addition of DOA modified SiO2 (D-SiO2) improves the homogeneity of PMMA/ENR 50 blend. However, the amount of DOA used in the modification affect the capability of forming hydrogen bonding with the neighbouring of polymer chain. Different amounts of DOA were used upon the surface modification of SiO2 filler and then were added into PMMA/ENR 50 blends doped with lithium tetrafluoroborate (LiBF4). The films were prepared by solvent casting technique. CHNS analysis proven the increases of percentage of carbon atoms in D-SiO2. The attachment of DOA on SiO2 surface was confirmed using Fourier transform infrared spectroscopy (FTIR) and ionic conductivity of PMMA/ENR 50/LiBF4 filled D-SiO2 films was measured by electrochemical impedance spectroscopy (EIS). The result shows the blend properties and ionic conductivity of PMMA/ENR 50 filled D-SiO2 films was improved due to surface modification of SiO2 filler.
Polymethyl methacrylate/50% epoxidized natural rubber (PE) blend and polymethyl methacrylate/50% epoxidized natural rubber/silicon dioxide (PE15) nanocomposites were successfully prepared via solvent casting method with tetrahydrofuran (THF) as solvent. The interactions between silicon dioxide (SiO 2) particles with polymethyl methacrylate (PMMA) and 50% epoxidized natural rubber (ENR 50) in PE and PE15 films were investigated using Fourier transform infrared (FTIR) analysis. Meanwhile, the phase separation between PMMA and ENR 50 in PE and PE15 films was monitored using optical microscopy (OM) analysis. FTIR analysis shows the presence of hydrogen bonding between PMMA and ENR 50 in PE film and functional groups responsible to the hydrogen bonding was identified. FTIR analysis also revealed that interactions between SiO 2 with PMMA and ENR 50 were SiO 2 weight percent dependent. While, OM analysis confirmed that phase separation between PMMA and ENR 50 also influenced by weight percent of SiO 2 .
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