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Reliable and unceasing exploitation of power electronic converters plays a major part in numerous applications. The aging effects on the performance of a DC-DC boost power converter with different thermal structures is under consideration in this study. This paper demonstrates the feasibility of using sensitivity analysis for a much more accurate estimation in the power converters' performances. This paper deals with a DC-DC boost converter as a case study in two thermal structures (coupled and decoupled) for electric vehicle application. Significant self and reciprocal effects of components can thoroughly impress the reliability assessment in the thermal coupled structure. It reveals that the useful lifetime of IGBT and diode can decrease by 35% and 44%, respectively. It is while that in the thermal decoupled structures, there are not significant reciprocal effects neither in electrical or thermal operating points. The results reveal the importance of reciprocal aging and self-aging effects on the reliability assessment in the coupled thermal structure.

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