SynopsisIt is shown how the shape of the longitudinal acoustic vibration observed in the low-frequency region of the Raman spectra of crystalline polymers can be used to obtain a quantitative distribution of lengths of straight-chain segments associated with polymer lamellas. The procedure is demonstrated for a "solid-state" extrudate of polyethylene and for a bulk-crystallized specimen of the same polymer. Equations relating the shape of the LAM-1 band to the shape of the distribution curve are given. The low intensity observed for the LAM-3 mode relative to LAM-1 is explained quantitatively without recourse to end effects. LAM-5 has been observed for bulk-crystallized polyethylene.For the extrudate we find the distribution of lengths of straight-chain segments to have a tail on the long-length side which is not present for the bulk-crystallized sample. The Raman technique is shown to provide new morphological data unattainable a t present by other methods.
Raman difference measurements are reported for an oriented polyethylene "solid-state" extrudate. The sample was found to be uniaxial at the center and nonuniaxial at the edge. Difference techniques lead to a resolution of the correlation split antisymmetric CC stretch (¡qM) and CH2 twisting (¡/7( )) fundamentals at room temperature. The splitting for the CH2 wagging ( 3( )) fundamental is observed for the first time and the higher frequency component is unambiguously assigned to species B2g(co). The degree of o axis orientation at the edge of the extrudate is estimated.
The microstructure of various shapes of stacking fault pyramids (SFPs) formed in multiple implant/anneal Separation by Implanted Oxygen (SIMOX) material were investigated by plan-view and cross-sectional transmission electron microscopy. In the multiple implant/anneal SIMOX, the defects in the top silicon layer are confined at the interface of the buried oxide layer at a density of ~10 6 cm -2 . The dominant defects are perfect and imperfect SFPs. The perfect SFPs were formed by the expansion and interaction of four dissociated dislocations on the {111} pyramidal planes. The imperfect SFPs show various shapes of SFPs, including I-, L-, and Y-shapes. The shape of imperfect SFPs may depend on the number of dissociated dislocations bounded to the top of the pyramid and the interaction of Shockley partial dislocations at each edge of {111} pyramidal planes.
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