We investigate the magnetic properties of epitaxial GaN:Gd layers as a function of the external magnetic field and temperature. An unprecedented magnetic moment is observed in this diluted magnetic semiconductor. The average value of the moment per Gd atom is found to be as high as 4000 micro(B) as compared to its atomic moment of 8 micro(B). The long-range spin polarization of the GaN matrix by Gd is also reflected in the circular polarization of magnetophotoluminescence measurements. Moreover, the materials system is found to be ferromagnetic above room temperature in the entire concentration range under investigation (7 x 10(15) to 2 x 10(19) cm(-3)). We propose a phenomenological model to understand the macroscopic magnetic behavior of the system. Our study reveals a close connection between the observed ferromagnetism and the colossal magnetic moment of Gd.
We report on the growth, structural as well as magnetic characterization of (Ga,Mn)N epitaxial layers grown directly on 4H–SiC(0001) by reactive molecular-beam epitaxy. We focus on two layers grown under identical conditions except for the Mn/Ga flux ratio. Structural characterization reveals that the sample with the lower Mn content is a uniform alloy, while in the layer with the higher Mn content, Mn-rich clusters are found to be embedded in the (Ga,Mn)N alloy matrix. Although the magnetic behavior of both the samples is similar at low temperatures, showing antiferromagnetic characteristics with a spin-glass transition, the sample with higher Mn content additionally exhibits ferromagnetic properties at and above room temperature. This ferromagnetism most likely originates from the Mn-rich clusters in this sample.
We investigate the structural and optical properties of M-plane GaN(11 00) films grown on LiAlO 2 (100) with nucleation layers grown at high and low temperatures. Samples with a high temperature nucleation layer are found to exhibit a highly anisotropic surface morphology with pronounced corrugation, which basically replicates the surface morphology of the substrate. Photoluminescence spectra of these layers are dominated by a transition at 3.356 eV, which is absent for samples with a low-temperature nucleation layer. In conjunction with scanning electron microscopy, cathodoluminescence maps reveal that this transition predominantly stems from regions below the trenches of the surface corrugation. Transmission electron microscopy shows an abundance of stacking faults within these regions. Excitation-dependent and time-resolved photoluminescence demonstrates the intrinsic character of the 3.356 eV emission, which is thus attributed to excitons bound to stacking faults acting as ultrathin vertical quantum wells in these samples. Low-temperature nucleation is imperative to avoid thermal roughening of the substrate and thus the formation of a high density of stacking faults.
We present a systematic study of growth, structural, and magnetic characterization of GaN: Gd layers grown directly on 6H-SiC͑0001͒ substrates by reactive molecular-beam epitaxy with a Gd concentration ranging from 7 ϫ 10 15 to 2 ϫ 10 19 cm −3 . The structural properties of these layers are found to be identical to those of undoped GaN layers. However, the magnetic characterization reveals an unprecedented effect. The average value of the magnetic moment per Gd atom is found to be as high as 4000 B as compared to its atomic moment of 8 B . Such a colossal magnetic moment can be explained in terms of a long range spin polarization of the GaN matrix by the Gd atoms which is reflected by the circular polarization of magnetophotoluminescence measurements. Moreover, the material system is found to exhibit ferromagnetism well above room temperature in the entire concentration range under investigation. We propose a phenomenological model to understand the macroscopic behavior of the system. Our study reveals a close connection between the observed ferromagnetism and the colossal magnetic moment of Gd.
The structural and the magnetic properties of Gd-focused ion-beam-implanted GaN layers are studied. Gd3+ ions were uniformly implanted in molecular beam epitaxy grown GaN layers at room temperature with an energy of 300keV at doses ranging from 2.4×1011to1.0×1015cm−2 which corresponds to an average Gd concentration range of 2.4×1016–1.0×1020cm−3. The implanted samples were not subjected to any annealing treatment. No secondary phase related to Gd was detected by x-ray diffraction in these layers. Magnetic characterization with superconducting quantum interference device reveals a colossal magnetic moment of Gd and ferromagnetism with an order temperature above room temperature similar to that found in epitaxially grown Gd-doped GaN layers. The effective magnetic moment per Gd atom in these samples is, however, found to be an order of magnitude larger than that found in epitaxially grown layers for a given Gd concentration which indicates that the defects play an important role in giving rise to this effect.
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