With increasing population the crisis of food is getting bigger day by day. In this time of crisis, the leaf disease of crops is the biggest problem in the food industry. In this paper, we have addressed that problem and proposed an efficient method to detect leaf disease. Leaf diseases can be detected from simple images of the leaves with the help of image processing and segmentation. Using k-means clustering and Otsu's method the faulty region in a leaf is detected which helps to determine proper course of action to be taken. Further the ratio of normal and faulty region if calculated would be able to predict if the leaf can be cured at all.
Kink effect is observed in Al0.83In0.17N/GaN high electron mobility transistor by measuring ID-VDS characteristics at a low sweep rate. It is inferred that the kink is induced due to the trapping/detrapping of charge carriers at deep levels present in the GaN buffer in the gate–drain access region. The detrapping of charge carriers from the deep levels is by the hot-electron-assisted mechanism. Two types of traps with activation energies, 0.29 eV (donor-like) and 0.57 eV (acceptor-like) were extracted by temperature-dependent transient drain current analysis. It is concluded that the deep-acceptor-like trap with a large emission time constant is responsible for the kink effect.
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