A model for calculating crucial ZnTe/PbTe superlattice parameters was developed. The model calculates the required film thicknesses that permit developing minibands in the structure. It also provides mini-band potential energy values. First order approximations were employed in a Krönig-Penny model to compute the above parameters. Uniform submicron ZnTe (as thin as 200 nm) and PbTe (as thin as 20nm) films have been electrodeposited onto indium tin oxide (ITO)-coated glass substrates. These films have been characterized structurally, chemically and optically. The results of the modeling and experiments are presented in this paper.
Thin films of lead telluride (PbTe) and zinc telluride (ZnTe) have been electrodeposited on indium tin oxide (ITO)-coated glass substrates. Uniform dense films of ∼ 100 nm have been obtained for both materials. The electrochemical deposition procedures for fabricating these films are described. The as-deposited films have been characterized by scanning electron microscopy, energy dispersive spectroscopy, and optical absorption spectrophotometry. Multi layer structures, up to 3 layers, of ZnTe/PbTe films, have been fabricated.
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