Erbium doped gallium nitride (Er:GaN) bulk crystals have emerged as a promising optical gain material for high energy lasers (HELs) operating at the 1.5 lm "retina-safe" spectral region. Among the many designs of HEL gain medium, the core-cladding planar waveguide (PWG) structure is highly desired due to its abilities to provide excellent optical confinement and heat dissipation. We report the realization of a GaN/Er:GaN/GaN core-cladding PWG structure synthesized by hydride vapor phase epitaxy and processed by mechanical and chemical-mechanical polishing. An Er doping concentration of [Er] ¼ 3 Â 10 19 atoms/cm 3 has been attained in the core layer, as confirmed by secondary ion mass spectrometry measurements. A strong 1.54 lm emission line was detected from the structure under 980 nm resonant excitation. It was shown that these PWGs can achieve a 96% optical confinement in the Er:GaN core layer having a thickness of 50 lm and [Er] ¼ 3 Â 10 19 atoms/cm 3 . This work represents an important step toward the realization of practical Er:GaN gain medium for retina-safe HEL applications.

Erbium-doped GaN (Er:GaN) quasi-bulk crystals are emerging as a promising novel gain medium for high energy lasers emitting at the retina-safe wavelength window of 1.5 μm. We report the polarization-resolved photoluminescence (PL) emission spectroscopy studies, which revealed that the pumping efficiency with the excitation polarization parallel to the c-axis of GaN (E⇀||c⇀) is significantly higher than that with the excitation polarization perpendicular to the c-axis of GaN (E⇀⊥c⇀). This phenomenon is a direct consequence of the inherent polar wurtzite GaN lattice, giving rise to a net local field, surrounding each Er ion, along the c-axis of GaN. The temperature dependent behaviors of the PL emission spectra were explained in terms of the Boltzmann population distributions among sublevels within the 4I15/2 ground state and the 4I13/2 first excited state of Er3+ in GaN, thereby providing an improved understanding regarding the origin of the dominant emission lines observed near 1.5 μm. The results suggested that the polarization field in GaN can be exploited to enhance the effective Er excitation cross section by manipulating the polarization of the excitation light source.

Erbium doped GaN (Er:GaN) is a promising candidate as a novel gain medium for solid-state high energy lasers (HELs) due to its superior physical properties over a synthetic garnet such as Nd:YAG. Er:GaN emits in the 1.5 µm region, which is retina-safe and has a high transmission in the air. We report photoluminescence (PL) studies performed on Er:GaN epilayers synthesized by the hydride vapor phase epitaxy (HVPE) technique. The room temperature PL spectra of HVPE grown Er:GaN epilayers resolved as many as 11 and seven emission lines in the 1.5 µm and 1.0 µm wavelength regions, respectively, corresponding to the intra-4f shell transitions between Stark levels from the first (4I13/2) and the second (4I11/2) excited states to the ground state (4I15/2) of Er3+ in GaN. The observed peak positions of these transitions enabled the construction of the detailed energy levels in Er:GaN. The results agree well with those of the calculation based on a crystal field analysis. Precise determination of the detailed energy levels of the Stark levels in the 4I11/2, 4I13/2, and 4I15/5 states is critically important for the realization of HELs based on Er:GaN.

Erbium-doped gallium nitride (Er:GaN) is a promising gain material for solid-state high-energy lasers operating in the 1.5  μm wavelength window due to the superior optical properties and extremely high thermal conductivity of a GaN host crystal that permit high-power and high-temperature applications. We report the realization of all-crystalline GaN/Er:GaN/GaN embedded waveguide fiber structures using the hydride vapor phase epitaxy growth and re-growth technique, along with chemical–mechanical polishing processes. The Er:GaN core layer possesses an Er doping concentration of [Formula: see text] atoms/cm3, confirmed by secondary ion mass spectrometry measurements. X-ray diffraction measurements confirm, respectively, c-, a-, and m-plane orientations for top/bottom, side, and front/back cross-sectional cladding layers of the fiber structure with good single-crystalline quality. The 1.5  μm Er3+ emission was detected from each surface of the fiber structures via 980 nm resonant excitation. The effect of 1.54  μm light guiding by the fiber structure has been demonstrated. This work laid the foundation toward achieving all-crystalline core-cladding fibers based on GaN wide bandgap semiconductor with potential applications in the harsh environments of high powers, power densities, and temperatures.