Spin dynamics of photoexcited carriers in GaAs/Al x Ga 1Ϫx As quantum wells have been investigated in a wafer containing twelve different single quantum wells, allowing full investigation of well-width and temperature dependences with minimal accidental variations due to growth conditions. The behavior at low temperatures is dominated by excitonic effects, confirming results described in detail by others. Between 50 and 90 K there is a transition from excitonic to free-carrier-dominated behavior; both the temperature and time scale of the transition are in excellent agreement with a theoretical model for exciton dissociation. Above 90 K we find two-component spin decays consisting of an unresolved component ͑faster than 2 ps͒ associated with exciton dissociation and hole spin-relaxation and a longer-lived component that yields the electron spin-relaxation time. In the free-carrier regime, the electron spin-relaxation rate in wide wells follows that for bulk GaAs, which varies approximately as T 2 . For narrow wells the rate is approximately independent of temperature and varies quadratically with confinement energy. This behavior is consistent with dominance of the D'yakonov-Perel mechanism of electron-spin relaxation and the expected behavior of the electron mobility. The data show evidence of the influence of electron scattering by interface roughness.

We have explored the dependence of electron spin relaxation in undoped GaAs/AlGaAs quantum wells on well width (confinement energy) at 300 K. For wide wells, the relaxation rate tends to the intrinsic bulk value due to the D’yakonov–Perel (DP) mechanism with momentum scattering by phonons. In narrower wells, there is a strong dependence of relaxation rate on well width, as expected for the DP mechanism, but also considerable variation between samples from different sources, which we attribute to differences in sample interface morphology.

We report results of a scanning spreading resistance microscopy ͑SSRM͒ and scanning capacitance microscopy ͑SCM͒ study of the distribution of charge carriers inside multi-quantum-well ͑MQW͒ buried heterostructure ͑BH͒ lasers. We demonstrate that individual quantum-well-barrier layers can be resolved using high-resolution SSRM. Calibrated SSRM and SCM measurements were performed on the MQW BH laser structure, by utilizing known InP dopant staircase samples to calibrate the instrumentation. Doping concentrations derived from SSRM and SCM measurements were compared with the nominal values of both p-and n-doped regions in the MQW BH lasers. For n-type materials, the accuracy was bias dependent with SSRM, while for SCM, excellent quantitative agreement between measured and nominal dopant values was obtained. The SSRM was able to measure the dopant concentration in the p-type materials with ϳ30% accuracy, but quantitative measurements could not be obtained with the SCM. Our results demonstrate the utility of combining calibrated SSRM and SCM to delineate quantitatively the transverse cross-sectional structure of complex two-dimensional devices such as MQW BH lasers, in which traditional one-dimensional probing using secondary ion mass spectroscopy provides only a partial picture of internal device structure.

Thin film optical waveguides of the chalcogenide glass Ga-La-S have been deposited on substrates of CaF2 and microscope glass by the technique of pulsed laser deposition. The chalcogenide properties of photobleaching, photodoping, and photoinduced refractive index changes have been observed and preliminary experiments carried out. The refractive index and thickness of the layer were verified using a waveguide ‘‘dark mode’’ analysis technique.

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