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In this paper, we present the results of case studies conducted in three software companies in order to identify the improvement targets in their test processes. The test processes were modeled using the LAPPI (A Light-weight Technique to Practical Process Modeling and Improvement Target Identification) technique. Identifying improvement targets quickly and in a cost-effective way is important to maximize the value of SPI (Software Process Improvement) initiatives. The most significant problems identified in this study were the low level of unit testing, unknown repercussions of code changes, and missing exit criteria for testing. These findings support the results of earlier studies. Further, a less reported problem was identified. It appears that software companies find it difficult to integrate test automation with their manual test processes. Making the recurring test related problems known among the software industry helps to justify the need for test process improvement and standardization of test processes.

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Abstract. In this paper we present how functional defect analysis can be applied for software process improvement (SPI) purposes. Software defect data is shown to be one of the most important available management information sources for SPI decisions. Our preliminary analysis with three software companies' defect data (11653 defects in total) showed that 65% of all the defects are functional defects. To better understand this mass, we have developed a detailed scheme for functional defect classification. Applying our scheme, defects can be classified with accuracy needed to generate practical results. The presented scheme is at initial stages of validation and has been tested with one software company's defect data consisting of 1740 functional defects. Based on the classification we were able to provide the case organization with practical improvement suggestions.