The electronic transport of epitaxial graphene on silicon carbide is anisotropic because of the anisotropy of the surface structure of the substrate. This letter presents a new method for measuring anisotropic transport based on the van der Pauw method. This method can measure anisotropic transport on the macroscopic scale without special equipment or device fabrication. We observe an anisotropic resistivity that has a ratio of maximum to minimum values of 1.62. The calculated maximum mobility is 2876 cm 2 ·V -1 ·s -1 , which is 1.43 times higher than that obtained with the standard van der Pauw method.